学术讲座

【南墙讲座】Graphene devices-from macroscopic to atomic scales and recent developments in the probing of material properties using advanced atomic force microscopy

题    目:  Graphene devices-from macroscopic to atomic scales and recent developments in the probing of material properties using advanced atomic force microscopy

讲座人:  Colm Durkan教授            剑桥大学

时   间: 9月15日(周五)上午10:00
        地   点:  颂恩楼220报告厅


嘉宾介绍:


Founder and head of the Scanning Probe Microscopy and Nanoelectronics group at the Nanoscience centre of the University of Cambridge;

Reader in Nanoscale Engineering

Fellow of Girton College, Cambridge;

Editorial board members of Microscopy and Imaging and Scientific Reports

Colms research is focused on understanding the fundamentals of the link between form (size & shape) and function in Nanomaterials, with an emphasis on advanced modes of microscopy and surface analysis, as applied to both highly-applied everyday problems as well as working on the underpinning science.